CaltechAUTHORS
Published December 2012 | Version Published
Journal Article Open

Measurement of the electrical resistivity and Hall coefficient at high temperatures

Creators

  • 1. ROR icon Aarhus University
  • 2. ROR icon Colorado School of Mines
  • 3. ROR icon Jet Propulsion Lab
  • 4. ROR icon California Institute of Technology

Abstract

The implementation of the van der Pauw (VDP) technique for combined high temperature measurement of the electrical resistivity and Hall coefficient is described. The VDP method is convenient for use since it accepts sample geometries compatible with other measurements. The technique is simple to use and can be used with samples showing a broad range of shapes and physical properties, from near insulators to metals. Three instruments utilizing the VDP method for measurement of heavily doped semiconductors, such as thermoelectrics, are discussed.

Additional Information

© 2012 American Institute of Physics. Received 25 June 2012; accepted 21 November 2012; published online 14 December 2012. We gratefully acknowledge the assistance of the NASA JPL thermoelectrics group for design, initial development, and testing, as well as funding for this project. The work was supported by the Danish National Research Foundation (Center for Materials Crystallography) and the Danish Strategic Research Council (Center for Energy Materials). E.S.T. acknowledges support from the U.S. National Science Foundation (NSF) MRSEC program—REMRSEC Center, Grant No. DMR-0820518. G.J.S acknowledges support of Fred Harris and others at BSST/Amerigon during the fabrication of the Caltech system.

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Published - RevSciInstrum_83_123902.pdf

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Additional details

Identifiers

Eprint ID
36891
Resolver ID
CaltechAUTHORS:20130213-080100624

Funding

NASA/JPL
Danish National Research Foundation
Danish Strategic Research Council
NSF MRSEC Program
DMR-0820518

Dates

Created
2013-02-13
Created from EPrint's datestamp field
Updated
2021-11-09
Created from EPrint's last_modified field

Caltech Custom Metadata

Other Numbering System Name
International Patent Classification (IPC)
Other Numbering System Identifier
G01R