CaltechAUTHORS
Published November 1969 | Version public
Journal Article Metadata-only

Basal Dislocation Density Measurements in Zinc

Creators

Abstract

Observations of dislocations in zinc using Berg-Barrett X-ray micrography confirm the validity of a dislocation etch for {1010} surfaces. A technique for measurement of the depth in which dislocations can be imaged in X-ray micrographs is given. This depth on (0001) surfaces of zinc was found to be 2.5 µ using a (1013) reflection and CoKα radiation.

Additional Information

© 1969 American Institute of Mining, Metallurgical, and Petroleum Engineers. Manuscript submitted April 14, 1969. This work was sponsored by the U.S. Atomic Energy Commission.

Additional details

Identifiers

Eprint ID
55518
Resolver ID
CaltechAUTHORS:20150304-124225961

Funding

Atomic Energy Commission

Dates

Created
2015-03-04
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Updated
2019-10-03
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