CaltechAUTHORS
Published January 1, 1983 | Version public
Technical Report Open

Techniques for Testing Integrated Circuits

Creators

Abstract

Abstract to be added.

Files

TR_4777_82.pdf

Files (14.7 MB)

Name Size
md5:6163d0c4695829209d9e3b13bde56df4
6.8 MB Preview Download
md5:6fb86b68d55e61653af0fbf295d450ad
7.9 MB Download

Additional details

Identifiers

Eprint ID
27059
Resolver ID
CaltechCSTR:1982.4777-tr-82

Dates

Created
2003-01-02
Created from EPrint's datestamp field
Updated
2019-10-03
Created from EPrint's last_modified field

Caltech Custom Metadata

Caltech groups
Computer Science Technical Reports