Published May 10, 1993
| Version public
Journal Article
Open
Direct determination of the ambipolar diffusion length in strained InxGa1−xAs/InP quantum wells by cathodoluminescence
Abstract
The ambipolar diffusion length is measured in strained InxGa1−xAs/InP quantum wells for several mole fractions in the interval 0.3
Additional Information
© 1993 American Institute of Physics. Received 21 December 1992; accepted 15 March 1993. The authors would like to acknowledge the support of the National Science Foundation. One of us (R.B.L.) would like to acknowledge the support of a National Defense Science and Engineering Graduate Fellowship.Files
LEEapl93.pdf
Additional details
Identifiers
- Eprint ID
- 10003
- Resolver ID
- CaltechAUTHORS:LEEapl93
Dates
- Created
-
2008-04-03Created from EPrint's datestamp field
- Updated
-
2021-11-08Created from EPrint's last_modified field