Published December 27, 1995 | Version Published
Book Section - Chapter Open

Oblique-incidence reflectometry: one relative profile measurement of diffuse reflectance yields two optical parameters

  • 1. ROR icon The University of Texas at Austin
  • 2. ROR icon Rice University
  • 3. ROR icon Lawrence Livermore National Laboratory

Abstract

A new, simple and quick approach, oblique-incidence reflectometry, was used to measure the absorption and reduced scattering coefficients of a semi-infinite turbid medium. An obliquely incident light beam causes the center of the far diffuse reflectance to shift from the point of incidence, where the far diffuse reflectance refers to the diffuse reflectance that is several transport mean free paths away from the incident point. The amount of shift yields the diffusion constant by a simple formula, and the slope of the diffuse reflectance yields the attenuation coefficient. Only the relative profile of the diffuse reflectance is needed to deduce both optical parameters, which makes this method attractive in clinical settings because it does not require a stringent calibration for absolute quantity measurements. This method was tested theoretically by Monte Carlo simulations and experimentally by a reflectometer. Because this method can be used to measure optical properties of biological tissues quickly and requires only inexpensive equipment, it has potential clinical application to the diagnosis of disease or monitoring of treatments.

Additional Information

© 1995 Society of Photo-Optical Instrumentation Engineers (SPIE). The project was sponsored in part by The Whitaker Foundation, Air Force Office of Scientific Research grant F49620-93-1-0298DEF, Department of Energy grant DE-FG05-91ER61226, and National Institutes of Health grant R29-HL45045.

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Identifiers

Eprint ID
91621
Resolver ID
CaltechAUTHORS:20181207-161549513

Funding

Whitaker Foundation
Air Force Office of Scientific Research (AFOSR)
F49620-93-1-0298DEF
Department of Energy (DOE)
DE-FG05-91ER61226
NIH
R29-HL45045

Dates

Created
2018-12-11
Created from EPrint's datestamp field
Updated
2021-11-16
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Caltech Custom Metadata

Series Name
Proceedings of SPIE
Series Volume or Issue Number
2627