Published July 1, 1994
| Version public
Journal Article
Open
Imaging spectroscopy with the atomic force microscope
Abstract
Force curve imaging spectroscopy involves acquiring a force-distance curve at each pixel of an atomic force microscope image. Processing of the resulting data yields images of sample hardness and tip-sample adhesion. These images resemble Z modulation images and the sum of forward and reverse friction images, respectively, and like them exhibit a number of potentially misleading contrast mechanisms. In particular, XY tip motion has a pronounced effect on hardness images and the meniscus force on adhesion images.
Additional Information
Copyright © 1994 American Institute of Physics. Received 15 November 1993; accepted 5 March 1994. This work was supported in part by a grant from Ford Motor Company and a NSF predoctoral fellowship (D.B.). We thank Topometrix, Inc. for the use of the TMX2000 electronic control unit and its associated computer hardware.Files
BASjap94.pdf
Additional details
Identifiers
- Eprint ID
- 4938
- Resolver ID
- CaltechAUTHORS:BASjap94
Dates
- Created
-
2006-09-14Created from EPrint's datestamp field
- Updated
-
2021-11-08Created from EPrint's last_modified field