CaltechAUTHORS
Published January 29, 2019 | Version Submitted
Discussion Paper Open

Apparatus to Measure Optical Scatter of Coatings Versus Annealing Temperature

Creators

Abstract

Light scattered by amorphous thin-film optical coatings limits the sensitivity of interferometric gravitational-wave detectors. We describe an imaging scatterometer to assess the role that crystal growth during annealing plays in this scatter.

Attached Files

Submitted - 1901.11400.pdf

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1901.11400.pdf

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Additional details

Identifiers

Eprint ID
94591
Resolver ID
CaltechAUTHORS:20190409-124545596

Related works

Describes
http://arxiv.org/abs/1901.11400 (URL)

Dates

Created
2019-04-09
Created from EPrint's datestamp field
Updated
2023-06-02
Created from EPrint's last_modified field

Caltech Custom Metadata

Caltech groups
LIGO , Physics Department
Other Numbering System Name
LIGO Document
Other Numbering System Identifier
P1700151