Published June 2012 | Version public
Book Section - Chapter

On-chip sensing and actuation methods for integrated self-healing mm-wave CMOS power amplifier

  • 1. ROR icon California Institute of Technology

Abstract

This paper presents various low power, compact, low insertion-loss sensors with digitized ADC output and digitally controlled actuation methods for on-chip characterization and healing of a mm-Wave power amplifier. We demonstrate low insertion loss (0.4dB) RF sensors which measure true input and output power in presence of load variations and very low-headroom (10–30mV) DC sensors with built-in regulators and thermal sensors as methods for measuring PA efficiency. All sensor outputs are digitized by a SAR-based ADC for communication with a central digital core. The paper also presents digitally controlled combiner tuning and PA bias actuation. The circuits are implemented in 45 nm SOI CMOS and enable full on-chip digitally controlled characterization and actuation of the PA with a power overhead of less than 6%.

Additional Information

© 2012 IEEE. Date of Current Version: 06 August 2012.

Additional details

Identifiers

Eprint ID
32979
Resolver ID
CaltechAUTHORS:20120807-104449736

Dates

Created
2012-08-07
Created from EPrint's datestamp field
Updated
2021-11-09
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