Published May 30, 2015 | Version public
Journal Article

Materials Characterization of Impregnated W and W-Ir Cathodes after Oxygen Poisoning

  • 1. ROR icon Jet Propulsion Lab
  • 2. ROR icon California Institute of Technology

Abstract

Electric thrusters use hollow cathodes as the electron source for generating the plasma discharge and for beam neutralization. These cathodes contain porous tungsten emitters impregnated with BaO material to achieve a lower surface work function and are operated with xenon propellant. Oxygen contaminants in the xenon plasma can poison the emitter surface, resulting in a higher work function and increased operating temperature. This could lead directly to cathode failure by preventing discharge ignition or could accelerate evaporation of the BaO material. Exposures over hundreds of hours to very high levels of oxygen can result in increased temperatures, oxidation of the tungsten substrate, and the formation of surface layers of barium tungstates. In this work, we present results of a cathode test in which impregnated tungsten and tungsten-iridium emitters were operated with 100 ppm of oxygen in the xenon plasma for several hundred hours. The chemical and morphological changes were studied using scanning electron microscopy, energy dispersive spectroscopy, and laser profilometry. The results provide strong evidence that high concentrations of oxygen accelerate the formation of tungstate layers in both types of emitters, a phenomenon not inherent to normal cathode operation. Deposits of pure tungsten were observed on the W-Ir emitter, indicating that tungsten is preferentially removed from the surface and transported in the insert plasma. A W-Ir cathode surface will therefore evolve to a pure W composition, eliminating the work function benefit of W-Ir. However, the W-Ir emitter exhibited less erosion and redeposition at the upstream end than the pure W emitter.

Additional Information

© 2015 Elsevier B.V. Received date: 10-11-2014; Revised date: 15-2-2015; Accepted date: 16-2-2015. Available online 23 February 2015. The authors would like to thank Al Owens, Ray Swindlehurst, and Ron Watkins for their assistance in preparing the test facility and Ron Ruiz and Jim Kulleck for their contributions in electron microscopy. The research described in this paper was carried out by the Jet Propulsion Laboratory, California Institute of Technology, under a contract with the National Aeronautics and Space Administration.

Additional details

Identifiers

Eprint ID
55633
DOI
10.1016/j.apsusc.2015.02.116
Resolver ID
CaltechAUTHORS:20150309-102101983

Funding

NASA/JPL/Caltech

Dates

Created
2015-03-10
Created from EPrint's datestamp field
Updated
2023-10-20
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