Published September 14, 2007 | Version Published
Book Section - Chapter Open

Comparing the low-temperature performance of megapixel NIR InGaAs and HgCdTe imager arrays

  • 1. ROR icon Jet Propulsion Lab
  • 2. ROR icon California Institute of Technology
  • 3. ROR icon University of Michigan–Ann Arbor
  • 4. ROR icon Rochester Institute of Technology
  • 5. ROR icon Lawrence Berkeley National Laboratory

Abstract

We compare a more complete characterization of the low temperature performance of a nominal 1.7um cut-off wavelength 1kx1k InGaAs (lattice-matched to an InP substrate) photodiode array against similar, 2kx2k HgCdTe imagers to assess the suitability of InGaAs FPA technology for scientific imaging applications. The data we present indicate that the low temperature performance of existing InGaAs detector technology is well behaved and comparable to those obtained for state-of-the-art HgCdTe imagers for many space astronomical applications. We also discuss key differences observed between imagers in the two material systems.

Additional Information

© 2007 Society of Photo-Optical Instrumentation Engineers (SPIE). The effort described herein was carried out at the Jet Propulsion Laboratory, California Institute of Technology, under a contract with the National Aeronautics and Space Administration and funded through the Science & Technology Infrastructure program. The detector development and procurement was sponsored by the United States Department of Energy under contract No. DE-AC02-05CH11231.

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Identifiers

Eprint ID
87225
Resolver ID
CaltechAUTHORS:20180619-110203529

Funding

NASA/JPL/Caltech
Department of Energy (DOE)
DE-AC02-05CH11231

Dates

Created
2018-06-19
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Updated
2021-11-15
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Caltech Custom Metadata

Series Name
Proceedings of SPIE
Series Volume or Issue Number
6690