Published 1998 | Version Published
Book Section - Chapter Open

Incorporating Test Inputs into Learning

Abstract

In many applications, such as credit default prediction and medical image recognition, test inputs are available in addition to the labeled training examples. We propose a method to incorporate the test inputs into learning. Our method results in solutions having smaller test errors than that of simple training solution, especially for noisy problems or small training sets.

Additional Information

© 1998 Massachusetts Institute of Technology. We would like to thank the Caltech Learning Systems Group: Prof. Yaser Abu-Mostafa, Dr. Amir Atiya, Alexander Nicholson, Joseph Sill and Xubo Song for many useful discussions.

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Identifiers

Eprint ID
64700
Resolver ID
CaltechAUTHORS:20160223-162630923

Dates

Created
2016-02-24
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Updated
2019-10-03
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Series Name
Advances in Neural Information Processing Systems
Series Volume or Issue Number
10