CaltechAUTHORS
Published December 1988 | Version public
Journal Article Metadata-only

Preparation of STM tips for in-situ characterization of electrode surfaces

Creators

  • 1. ROR icon California Institute of Technology
  • 2. ROR icon Stanford University

Abstract

The total current between the tip and the sample in a scanning tunnelling microscopy study of a solid/liquid interface can be dominated by Faradaic charge transfer currents. In such a situation, feedback control of the tunnelling gap, and imaging, is precluded. In this contribution we describe the preparation of glass and polymer coated STM tips that possess < 100 Ų of exposed metal. These tips effectively discriminate against Faradaic current and enable STM imaging in the presence of reversible electroactive solution species at appreciable tip/sample biases.

Additional Information

© 1988 Blackwell Science. The authors would like to thank Christopher Lang and Alison Baski for assisting in the construction of the microscope. We acknowledge the Office of Naval Research, grant no. N00014-85-K-0805, for support of this research. N.S.L. acknowledges additional support from the Camille and Henry Dreyfus Foundation Teacher-Scholar program. C.F.Q. acknowledges support from the Defense Advanced Research Projects Agency.

Additional details

Identifiers

Eprint ID
120986
Resolver ID
CaltechAUTHORS:20230418-318458000.22

Funding

Office of Naval Research (ONR)
N00014-85-K-0805
Camille and Henry Dreyfus Foundation
Defense Advanced Research Projects Agency (DARPA)

Dates

Created
2023-04-24
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Updated
2023-04-24
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