Published July 2008 | Version Published
Book Section - Chapter Open

(Invited) mm-wave silicon ICs: An opportunity for holistic design

  • 1. ROR icon California Institute of Technology

Abstract

Millimeter-waves integrated circuits offer a unique opportunity for a holistic design approach encompassing RF, analog, and digital, as well as radiation and electromagnetics. The ability to deal with the complete system from the digital circuitry to on-chip antennas and everything in between offers unparalleled opportunities for completely new architectures and topologies, previously impossible due the traditional partitioning of various blocks in conventional design. This opens a plethora of new architectural and system level innovation within the integrated circuit platform. This paper reviews some of the challenges and opportunities for mm-wave ICs and presents several solutions to them.

Additional Information

© 2008 IEEE. Issue Date: June 17 2008-April 17 2008; Date of Current Version: 15 July 2008. The author thanks the contributions of A. Babakhani, Y. Wang, and H. Wang, Prof. D. B. Rutledge, Prof. S. Weinreb of Caltech and Dr. A. Natarajan, Dr. I. Aoki, Dr. S. Kee, Dr. A. Komijani, Dr. X. Guan, Prof. H. Hashemi, Prof. J. Buckwalter, and Prof. E. Afshari formerly of Caltech for the numerous contribution to Caltech's mm-wave activities. We have benefitted from the support of Caltech's Lee Center for Advance Networking, National Science Foundation, and DARPA Trusted Foundry Program.

Attached Files

Published - Hajimiri2008p85852008_Ieee_Radio_Frequency_Integrated_Circuits_Symposium_Vols_1_And_2.pdf

Files

Hajimiri2008p85852008_Ieee_Radio_Frequency_Integrated_Circuits_Symposium_Vols_1_And_2.pdf

Additional details

Identifiers

Eprint ID
18776
Resolver ID
CaltechAUTHORS:20100623-113521881

Funding

Caltech's Lee Center for Advanced Networking
NSF
Defense Advanced Research Projects Agency (DARPA) Trusted Foundry Program

Dates

Created
2010-06-23
Created from EPrint's datestamp field
Updated
2021-11-08
Created from EPrint's last_modified field

Caltech Custom Metadata

Series Name
IEEE Radio Frequency Integrated Circuits Symposium
Other Numbering System Name
INSPEC Accession Number
Other Numbering System Identifier
10103390