Published August 2003
| Version Published
Journal Article
Open
Low Voltage FESEM of Geological Materials
Abstract
Low voltage FESEM (i.e., operated at several hundred volts to 5 kV) which offers advantages in surface imaging due to reduced beam penetration, was found to be particularly useful in the investigation of uncoated, fine geological materials down to nano-scale. Here are three examples to highlight projects being conducted in our FESEM facility.
Additional Information
© 2003 Microscopy Society of America. Published online: 24 July 2003. Extended abstract of a paper presented at Microscopy and Microanalysis 2003 in San Antonio, Texas, USA, August 3–7, 2003. The Caltech Geology FESEM facility is supported in part by the MRSEC Program of the NSF under DMR-0080065. The projects are funded by the White Rose Foundation and the NSF.Attached Files
Published - S1431927603444954a.pdf
Files
S1431927603444954a.pdf
Additional details
Identifiers
- Eprint ID
- 38222
- Resolver ID
- CaltechAUTHORS:20130502-074541444
Related works
- Describes
- http://resolver.caltech.edu/CaltechAUTHORS:20130430-100136607 (URL)
Funding
- NSF MRSEC Program
- DMR-0080065
- White Rose Foundation
- NSF
Dates
- Created
-
2013-05-06Created from EPrint's datestamp field
- Updated
-
2021-11-09Created from EPrint's last_modified field
Caltech Custom Metadata
- Caltech groups
- Division of Geological and Planetary Sciences (GPS)