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Published June 2003 | Version public
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Convergence analysis of SCCC and SCTCM with 'in-line' interleaver

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  • 1. ROR icon Sony (Japan)
  • 2. ROR icon California Institute of Technology

Abstract

This paper presents a technique for analyzing the performance of SCCC and SCTCM systems that use 'in-line' interleavers. This technique is a multidimensional extension of the well-known EXIT chart analysis, and enables us to optimize the constituent codes when in-line interleavers are used.

Additional Information

© 2003 IEEE. Issue Date: 29 June-4 July 2003. Date of Current Version: 15 September 2003.

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Eprint ID
27282
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CaltechAUTHORS:20111018-132205471

Dates

Created
2011-10-26
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Updated
2021-11-09
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8555315