CaltechAUTHORS
Published October 1996 | Version Published
Book Section - Chapter Open

A wafer-scale MEMS and analog VLSI system for active drag reduction

Creators

  • 1. ROR icon California Institute of Technology

Abstract

We describe an analog CMOS VLSI system that can process real-time signals from integrated shear stress sensors to detect regions of high shear stress along a surface in an airflow. The outputs of the CMOS circuit control the actuation of integrated micromachined flaps with the goal of reducing this high shear stress on the surface and thereby lowering the total drag. We have designed, fabricated, and tested components of this system in a wind tunnel in both laminar and turbulent flow regimes with the goal of building a wafer-scale system.

Additional Information

© 1996 IEEE. This work is supported in part by the Center for Neuromorphic Systems Engineering as a part of the National Science Foundation Engineering Research Center Program under grant EEC-9402726, and by the California Trade and Commerce Agency, Office of Strategic Technology under grant C94-0165. This work 1s also supported in part by ARPA-IONR under grant no N00014-93-1-0990, and by an AFOSR University Research Initiative grant no F49620-93-1-0332.

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Additional details

Identifiers

Eprint ID
94007
Resolver ID
CaltechAUTHORS:20190320-151208784

Funding

Center for Neuromorphic Systems Engineering, Caltech
NSF
EEC-9402726
California Trade and Commerce Agency
C94-0165
Office of Naval Research (ONR)
N00014-93-1-0990
Air Force Office of Scientific Research (AFOSR)
F49620-93-1-0332

Dates

Created
2019-03-20
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Updated
2021-11-16
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