Published March 15, 2018 | Version public
Book Section - Chapter

Fourier ptychography for parallel microscopy

Abstract

Fourier Ptychography has shown that we can computationally correct physical aberrations. Thereby, allow us to move beyond the traditional strategy of accomplishing high quality imaging through the exacting refinement of the physical microscope system. I will report on the use of Fourier Ptychography to implement high quality parallel imaging with plastic molded lenses for 96 well plate imaging.

Additional Information

© 2018 Society of Photo-optical Instrumentation Engineers (SPIE).

Additional details

Identifiers

Eprint ID
87908
Resolver ID
CaltechAUTHORS:20180717-081043968

Dates

Created
2018-07-17
Created from EPrint's datestamp field
Updated
2021-11-16
Created from EPrint's last_modified field

Caltech Custom Metadata

Series Name
Proceedings of SPIE
Series Volume or Issue Number
10505