CaltechAUTHORS
Published April 2012 | Version Supplemental Material
Journal Article Open

Visualizing Electrical Breakdown and ON/OFF States in Electrically Switchable Suspended Graphene Break Junctions

Creators

  • 1. ROR icon University of California, Riverside
  • 2. ROR icon California Institute of Technology

Abstract

Narrow gaps are formed in suspended single- to few-layer graphene devices using a pulsed electrical breakdown technique. The conductance of the resulting devices can be programmed by the application of voltage pulses, with voltages of 2.5 to ~4.5 V, corresponding to an ON pulse, and ~8 V, corresponding to an OFF pulse. Electron microscope imaging of the devices shows that the graphene sheets typically remain suspended and that the device conductance tends to zero when the observed gap is large. The switching rate is strongly temperature dependent, which rules out a purely electromechanical switching mechanism. This observed switching in suspended graphene devices strongly suggests a switching mechanism via atomic movement and/or chemical rearrangement and underscores the potential of all-carbon devices for integration with graphene electronics.

Additional Information

© 2012 American Chemical Society. Received: September 10, 2011. Revised: March 15, 2012. Publication Date (Web): March 19, 2012. The authors acknowledge the support by NSF CAREER DMR/0748910, NSF DMR/1106358, NSF ECCS/0926056, ONR N00014-09-1-0724, ONR/DMEA H94003-10-2-1003 and the FENA Focus Center. CNL acknowledges the support by the "Physics of Graphene" program at KITP.

Attached Files

Supplemental Material - nl203160x_si_002.mov

Supplemental Material - nl203160x_si_003.mov

Supplemental Material - nl203160x_si_004.mov

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Additional details

Identifiers

Eprint ID
31365
Resolver ID
CaltechAUTHORS:20120508-155354443

Funding

NSF CAREER
DMR/0748910
NSF CAREER
DMR/1106358
NSF
ECCS/0926056
ONR
N00014-09-1-0724
ONR/DMEA
H94003-10-2-1003
FENA Focus Center
Physics of Graphene program at KITP

Dates

Created
2012-05-09
Created from EPrint's datestamp field
Updated
2021-11-09
Created from EPrint's last_modified field