CaltechAUTHORS
Published 1995 | Version Published
Book Section - Chapter Open

Silicon Detector Studies with an Interferometric Thickness Mapper

Creators

Contributors

Abstract

A laser-interferometer system has been developed to precisely map the thickness variations of large-area silicon detectors. We describe the design and operation of the apparatus and the data processing carried out to derive thickness maps. We compare the results with a map made using accelerator beams of energetic heavy ions.

Additional Information

© IUPAP. Provided by the NASA Astrophysics Data System. We are grateful to R Radocinski and B. Sears for help with the data processing. The research described in this paper was supported by the National Aeronautics and Space Administration at the California Institute of Technology (under contract NAS5-32626 and grant NAGW-1919) and the Jet Propulsion Laboratory. Equipment funding was provided, in part, by the JPL Equipment and Instrumentation Committee.

Attached Files

Published - 1995-33.pdf

Files

1995-33.pdf

Files (960.5 kB)

Name Size
md5:8a8037adcd3c0a53b7e86961419e11ce
960.5 kB Preview Download

Additional details

Identifiers

Eprint ID
46369
Resolver ID
CaltechAUTHORS:20140619-144903064

Related works

Describes
http://adsabs.harvard.edu/abs/1995ICRC....4.1283M (URL)

Funding

NASA
NAS5-32626
NASA
NAGW-1919
JPL Equipment and Instrumentation Committee

Dates

Created
2014-07-10
Created from EPrint's datestamp field
Updated
2020-03-09
Created from EPrint's last_modified field

Caltech Custom Metadata

Caltech groups
Space Radiation Laboratory , Physics Department
Other Numbering System Name
Space Radiation Laboratory
Other Numbering System Identifier
1995-33