Published June 2000
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Empirical load-line capacitance models for HEMT
Abstract
Models for describing the gate-source and gate-drain capacitances' variation along a resistive load line have been proposed. They are charge conservative and consistent with the small-signal model at bias points along the load line. The extraction procedure for the models' parameters is fast and intuitive. The models can be implemented easily in most circuit simulator programs.
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© 2000 IEEE.Attached Files
Published - 00862232.pdf
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00862232.pdf
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- CaltechAUTHORS:20180802-142536217
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2018-08-02Created from EPrint's datestamp field
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2021-11-16Created from EPrint's last_modified field
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